SiREM is pleased to be an active participant at the Tenth International Conference on Remediation and Management of Contaminated Sediments, February 11-14, 2019, in New Orleans, Louisiana.

Michael Healey (SiREM) will present “Comprehensive In Situ and Ex Situ Passive Sampling Programs to Investigate Freely-Dissolved Metals, Inorganic Analytes, OCPs, and PCBs” as a platform presentation. Michael will also present “Peepers for Sediment Porewater: Doing it Right and Doing it Better” as a poster. Jeff Roberts (SiREM) will present “Surfactant Flushing Column Study to Optimize Field Performance” as a poster. Jeff and Michael will also be hosting a Learning Lab in the Exhibit Hall

“Passive Samplers in the Field – Deployment and Retrieval without Divers”.

SiREM’s products and services will be featured in numerous other presentations at the conference.

Please visit us at Booth # 131 to speak with our remediation professionals about SiREM’s leading edge products and services.